Measuring dielectric properties at the nanoscale using Electrostatic Force Microscopy
نویسندگان
چکیده
R. Arinero, C. Riedel, G. A. Schwartz, G. Lévêque, A. Alegría, Ph. Tordjeman, N. E. Israeloff, M. Ramonda and J. Colmenero 1 IES, UMR CNRS 5214, Université Montpellier II, CC 083, Place E. Bataillon, 34095 Montpellier Cedex, France 2 Donostia International Physics Center (DIPC), Paseo Manuel de Lardizábal 4, 20018 San Sebastián, Spain. 3 Departamento de Física de Materiales UPV/EHU, Facultad de Química, Apartado 1072, 20080 San Sebastián, Spain. 4 Centro de Física de Materiales CSIC-UPV/EHU, Paseo M. De Lardizábal 5, 20018 San Sebastián, Spain. 5 IMFT, Université de Toulouse – CNRS, 1 Allée du Professeur Camille Soula, 31400 Toulouse, France. Department of Physics, Northeastern University, Boston, Massachusetts 02115, USA Laboratoire de Microscopie en Champ Proche (LMCP), Centre de Technologie de Montpellier, Université Montpellier II, CC 082, Place E. Bataillon, 34095 Montpellier Cedex, France
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تاریخ انتشار 2010